SPIE Proceedings [SPIE SPIE Medical Imaging - Orlando, Florida, United States (Saturday 11 February 2017)] Medical Imaging 2017: Computer-Aided Diagnosis - Case-based statistical learning applied to SPECT image classification
Armato, Samuel G., Petrick, Nicholas A., Górriz, Juan M., Ramírez, Javier, Illán, I. A., Martínez-Murcia, Francisco J., Segovia, Fermín, Salas-Gonzalez, Diego, Ortiz, A.Volume:
10134
Year:
2017
Language:
english
DOI:
10.1117/12.2253853
File:
PDF, 6.44 MB
english, 2017