Assessment of engineered surfaces roughness by...

Ultramicroscopy 2017 / 06 Vol. 177

Assessment of engineered surfaces roughness by high-resolution 3D SEM photogrammetry

Gontard, L.C., López-Castro, J.D., González-Rovira, L., Vázquez-Martínez, J.M., Varela-Feria, F.M., Marcos, M., Calvino, J.J.
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Volume:
177
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2017.03.007
Date:
June, 2017
File:
PDF, 1.46 MB
english, 2017
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