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[IEEE Comput. Soc Ninth Asian Test Symposium - Taipei, Taiwan (4-6 Dec. 2000)] Proceedings of the Ninth Asian Test Symposium - A case study of failure analysis and guardband determination for a 64M-bit DRAM
Chin-Te Kao,, Wu, S., Chen, J.E.Year:
2000
Language:
english
DOI:
10.1109/ATS.2000.893665
File:
PDF, 394 KB
english, 2000