[IEEE 2016 IEEE 59th International Midwest Symposium on...

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[IEEE 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS) - Abu Dhabi, United Arab Emirates (2016.10.16-2016.10.19)] 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS) - Variable latching phenomenon in CE BJT and its impact

Sharma, Bijay Kumar
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Year:
2016
Language:
english
DOI:
10.1109/MWSCAS.2016.7869976
File:
PDF, 233 KB
english, 2016
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