[IEEE 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS) - Abu Dhabi, United Arab Emirates (2016.10.16-2016.10.19)] 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS) - A regression based methodology to estimate SNM for improving yield of 6T SRAM

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