![](/img/cover-not-exists.png)
[IEEE 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS) - Abu Dhabi, United Arab Emirates (2016.10.16-2016.10.19)] 2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS) - Self-timed automatic test pattern generation for null convention logic
Nemati, Nastaran, Reed, Mark C., Parameswaran, Sri, Fant, KarlYear:
2016
Language:
english
DOI:
10.1109/MWSCAS.2016.7870032
File:
PDF, 258 KB
english, 2016