An Improved Flicker Noise Model for Circuit Simulations

IEEE Transactions on Electron Devices 2017 / 4 Vol. 64; Iss. 4

An Improved Flicker Noise Model for Circuit Simulations

Roy, Ananda S., Kim, Sungwon, Mudanai, Sivakumar P.
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Volume:
64
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2017.2669153
Date:
April, 2017
File:
PDF, 1.12 MB
english, 2017
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