![](/img/cover-not-exists.png)
On the short-circuit and avalanche ruggedness reliability assessment of SiC MOSFET modules
Ionita, Claudiu, Nawaz, Muhammad, Ilves, KalleVolume:
71
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.02.004
Date:
April, 2017
File:
PDF, 4.36 MB
english, 2017