Dynamic Erase Voltage and Time Scaling for Extending...

IEEE Transactions on Computers 2017 / 4 Vol. 66; Iss. 4

Dynamic Erase Voltage and Time Scaling for Extending Lifetime of NAND Flash-Based SSDs

Jeong, Jaeyong, Song, Youngsun, Hahn, Sangwook Shane, Lee, Sungjin, Kim, Jihong
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Volume:
66
Language:
english
Journal:
IEEE Transactions on Computers
DOI:
10.1109/tc.2016.2615038
Date:
April, 2017
File:
PDF, 2.12 MB
english, 2017
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