[ASME STLE/ASME 2008 International Joint Tribology Conference - Miami, Florida, USA (October 20–22, 2008)] STLE/ASME 2008 International Joint Tribology Conference - Wear of Silicon and Carbon-Based Nanoscale Asperities
Liu, Jingjing, O’Connor, Sean D., Gotsmann, Bernd, Lantz, Mark A., Cannara, Rachel J., Notbohm, Jacob, Moldovan, Nicolaie, Carlisle, John A., Sridharan, Kumar, Turner, Kevin T., Carpick, Robert W.Year:
2008
Language:
english
DOI:
10.1115/IJTC2008-71135
File:
PDF, 64 KB
english, 2008