[IEEE 2016 3rd International Conference on Electrical...

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[IEEE 2016 3rd International Conference on Electrical Engineering and Information Communication Technology (ICEEICT) - Dhaka, Bangladesh (2016.9.22-2016.9.24)] 2016 3rd International Conference on Electrical Engineering and Information Communication Technology (ICEEICT) - A comparative analytical approach for gate leakage current optimization in silicon MOSFET: A step to more reliable electronic device

Khan, Asif Abdullah, Audhikary, Aran, Fahim-Al-Fattah, Md., Amin, Md. Ashiqul, Nandi, Rajesh
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Year:
2016
Language:
english
DOI:
10.1109/CEEICT.2016.7873116
File:
PDF, 3.56 MB
english, 2016
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