[IEEE 2016 3rd International Conference on Electrical Engineering and Information Communication Technology (ICEEICT) - Dhaka, Bangladesh (2016.9.22-2016.9.24)] 2016 3rd International Conference on Electrical Engineering and Information Communication Technology (ICEEICT) - A comparative analytical approach for gate leakage current optimization in silicon MOSFET: A step to more reliable electronic device
Khan, Asif Abdullah, Audhikary, Aran, Fahim-Al-Fattah, Md., Amin, Md. Ashiqul, Nandi, RajeshYear:
2016
Language:
english
DOI:
10.1109/CEEICT.2016.7873116
File:
PDF, 3.56 MB
english, 2016