[IEEE 2017 IEEE 17th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) - Phoenix, AZ, USA (2017.1.15-2017.1.18)] 2017 IEEE 17th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) - A D-band tuner for in-situ noise and power characterization in BiCMOS 55 nm

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