O Thickness on the Bandwidth of Metal–Semiconductor–Metal Bandpass Photodetectors
Hwang, Jun-Dar, Lin, Guan-Syun, Hwang, Sheng-BengVolume:
64
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2016.2628727
Date:
January, 2017
File:
PDF, 1.26 MB
english, 2017