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Diffuse Layer Effect on Electron-Transfer Kinetics Measured by Scanning Electrochemical Microscopy (SECM)
Bae, Je Hyun, Yu, Yun, Mirkin, Michael V.Volume:
8
Language:
english
Journal:
The Journal of Physical Chemistry Letters
DOI:
10.1021/acs.jpclett.7b00161
Date:
April, 2017
File:
PDF, 782 KB
english, 2017