![](/img/cover-not-exists.png)
[IEEE 2015 IEEE 11th International Conference on ASIC (ASICON ) - Chengdu, China (2015.11.3-2015.11.6)] 2015 IEEE 11th International Conference on ASIC (ASICON) - Survey and statistical analysis of THz detectors
Li, Xu-Guang, Yan, Dong, Fu, Hai-Peng, Ma, Jian-GuoYear:
2015
Language:
english
DOI:
10.1109/asicon.2015.7516974
File:
PDF, 206 KB
english, 2015