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SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 28 January 2017)] Photonic Instrumentation Engineering IV - Highly sensitive measurement of submicron waveguides based on Brillouin scattering
Soskind, Yakov G., Olson, Craig, Godet, Adrien, Ndao, Abdoulaye, Sylvestre, Thibaut, Beugnot, Jean-Charles, Phan Huy, KienVolume:
10110
Year:
2017
Language:
english
DOI:
10.1117/12.2253703
File:
PDF, 685 KB
english, 2017