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[ACM Press the 35th International Conference - Austin, Texas (2016.11.07-2016.11.10)] Proceedings of the 35th International Conference on Computer-Aided Design - ICCAD '16 - Dynamic reliability management for near-threshold dark silicon processors
Kim, Taeyoung, Sun, Zeyu, Cook, Chase, Gaddipati, Jagadeesh, Wang, Hai, Chen, Haibao, Tan, Sheldon X.-D.Year:
2016
Language:
english
DOI:
10.1145/2966986.2980080
File:
PDF, 414 KB
english, 2016