SPIE Proceedings [SPIE SPIE BiOS - San Francisco, California, United States (Saturday 28 January 2017)] Optical Diagnostics and Sensing XVII: Toward Point-of-Care Diagnostics - Simulation of diffuse reflectance for characterisation of particle suspensions
Coté, Gerard L., Thomson, Kelly, Stoliarskaia, Daria, Tiernan-Vandermotten, Sarra, Lue, Leo, Chen, Yi-ChiehVolume:
10072
Year:
2017
Language:
english
DOI:
10.1117/12.2252502
File:
PDF, 495 KB
english, 2017