Direct Observation of the Outermost Surfaces of Mesoporous Silica Thin Films by High Resolution Ultralow Voltage Scanning Electron Microscopy
Kobayashi, Maho, Susuki, Kyoka, Otsuji, Haruo, Sakuda, Yusuke, Asahina, Shunsuke, Kikuchi, Naoki, Kanazawa, Toshiyuki, Kuroda, Yoshiyuki, Wada, Hiroaki, Shimojima, Atsushi, Kuroda, KazuyukiVolume:
33
Language:
english
Journal:
Langmuir
DOI:
10.1021/acs.langmuir.6b04511
Date:
March, 2017
File:
PDF, 3.45 MB
english, 2017