Application of transmission electron microscopy and focused...

Physica Scripta 2011 / 12 Vol. T145

Application of transmission electron microscopy and focused ion beam tomography for microstructure characterization of tungsten based materials

Milc, S, Kruk, A, Cempura, G, Penkalla, H J, Thomser, C, Czyrska-Filemonowicz, A
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Volume:
T145
Language:
english
Journal:
Physica Scripta
DOI:
10.1088/0031-8949/2011/T145/014043
Date:
December, 2011
File:
PDF, 909 KB
english, 2011
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