Line length dependence of threshold current density and...

Journal of Applied Physics 2008 / 04 Vol. 103; Iss. 7

Line length dependence of threshold current density and driving force in eutectic SnPb and SnAgCu solder electromigration

Yoon, Min-Seung, Ko, Min-Ku, Kim, Bit-Na, Kim, Byung-Joon, Park, Yong-Bae, Joo, Young-Chang
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Volume:
103
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2890412
Date:
April, 2008
File:
PDF, 384 KB
english, 2008
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