Resolving hot spot microstructure using x-ray penumbral...

Review of Scientific Instruments 2016 / 11 Vol. 87; Iss. 11

Resolving hot spot microstructure using x-ray penumbral imaging (invited)

Bachmann, B., Hilsabeck, T., Field, J., Masters, N., Reed, C., Pardini, T., Rygg, J. R., Alexander, N., Benedetti, L. R., Döppner, T., Forsman, A., Izumi, N., LePape, S., Ma, T., MacPhee, A. G., Nagel
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Volume:
87
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4959161
Date:
November, 2016
File:
PDF, 5.74 MB
english, 2016
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