SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Sunday 3 April 2016)] Optical Modelling and Design IV - Modern approaches for a design and development of optoelectronic measuring systems
Wyrowski, Frank, Sheridan, John T., Meuret, Youri, Nekrylov, Ivan S., Korotaev, Valery V., Denisov, Victor M., Kleshchenok, Maksim A.Volume:
9889
Year:
2016
Language:
english
DOI:
10.1117/12.2227936
File:
PDF, 530 KB
english, 2016