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Studying Shocked Material Dynamics with Ultrafast X-rays
Sandberg, R.L., Bolme, C., Ramos, K., McCulloch, Q., Martinez, R., Hamilton, V., Pierce, T., Greenfield, M., McGrane, S., Barber, J.L., Abbey, B., Schropp, A., Seiboth, F., Heiman, P., Nagler, B., GalVolume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S143192761501003X
Date:
August, 2015
File:
PDF, 160 KB
english, 2015