Fundamental Study on a Mechanism of Faulty Outputs from Cryptographic Modules Due to IEMI
HAYASHI, YU-ICHI, HOMMA, NAOFUMI, MIZUKI, TAKAAKI, AOKI, TAKAFUMI, SONE, HIDEAKIVolume:
99
Language:
english
Journal:
Electronics and Communications in Japan
DOI:
10.1002/ecj.11855
Date:
September, 2016
File:
PDF, 1.37 MB
english, 2016