The Determination of Unity Gain for InGaAs/InP Avalanche Photodiodes With Excess Noise Measurements
Tu, Junjie, Zhao, Yanli, Wen, Ke, Li, Qian, Li, YuanVolume:
29
Language:
english
Journal:
IEEE Photonics Technology Letters
DOI:
10.1109/LPT.2017.2676028
Date:
April, 2017
File:
PDF, 689 KB
english, 2017