[IEEE 2017 IEEE 15th International Symposium on Applied...

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[IEEE 2017 IEEE 15th International Symposium on Applied Machine Intelligence and Informatics (SAMI) - Herl'any, Slovakia (2017.1.26-2017.1.28)] 2017 IEEE 15th International Symposium on Applied Machine Intelligence and Informatics (SAMI) - Application and properties of the radon transform for object image matching

Kertesz, Gabor, Szenasi, Sandor, Vamossy, Zoltan
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Year:
2017
Language:
english
DOI:
10.1109/SAMI.2017.7880333
File:
PDF, 783 KB
english, 2017
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