A Novel Framework for Fault Diagnosis Using Kernel Partial...

IEEE Transactions on Industrial Electronics 2017 / 5 Vol. 64; Iss. 5

A Novel Framework for Fault Diagnosis Using Kernel Partial Least Squares Based on an Optimal Preference Matrix

Yi, Jun, Huang, Di, He, Haibo, Zhou, Wei, Han, Qi, Li, Taifu
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Volume:
64
Language:
english
Journal:
IEEE Transactions on Industrial Electronics
DOI:
10.1109/tie.2017.2668986
Date:
May, 2017
File:
PDF, 3.71 MB
english, 2017
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