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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Reflection, Scattering, and Diffraction from Surfaces V - Enhanced sensitivity for optical loss measurement in planar thin-films (Conference Presentation)
Hanssen, Leonard M., Yuan, Hua-KangVolume:
9961
Year:
2016
Language:
english
DOI:
10.1117/12.2237132
File:
PDF, 107 KB
english, 2016