SPIE Proceedings [SPIE Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016) - Suzhou, China (Tuesday 26 April 2016)] 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials - RMB identification based on polarization parameters inversion imaging
Luo, Xiangang, Ye, Tianchun, Xin, Tingwen, Hu, Song, Hong, Minghui, Gu, Min, Liu, Guoyan, Gao, Kun, Liu, Xuefeng, Ni, GuoqiangVolume:
9685
Year:
2016
Language:
english
DOI:
10.1117/12.2241651
File:
PDF, 700 KB
english, 2016