Time-dependent dielectric breakdown of MgO magnetic tunnel junctions and novel test method
Kim, Kyungjun, Choi, Chulmin, Oh, Youngtaek, Sukegawa, Hiroaki, Mitani, Seiji, Song, YunheubVolume:
56
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.56.04CN02
Date:
April, 2017
File:
PDF, 1.21 MB
english, 2017