Time-dependent dielectric breakdown of MgO magnetic tunnel...

Time-dependent dielectric breakdown of MgO magnetic tunnel junctions and novel test method

Kim, Kyungjun, Choi, Chulmin, Oh, Youngtaek, Sukegawa, Hiroaki, Mitani, Seiji, Song, Yunheub
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Volume:
56
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.56.04CN02
Date:
April, 2017
File:
PDF, 1.21 MB
english, 2017
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