Inspection equipment study for subway tunnel defects by...

Inspection equipment study for subway tunnel defects by grey-scale image processing

Huang, Hongwei, Sun, Yan, Xue, Yadong, Wang, Fei
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Volume:
32
Language:
english
Journal:
Advanced Engineering Informatics
DOI:
10.1016/j.aei.2017.03.003
Date:
April, 2017
File:
PDF, 3.47 MB
english, 2017
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