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An application of Mueller matrix polarimetry for characterising properties of thin film with surface roughness
Phan, Quoc-Hung, Lo, Yu-Lung, Bellouard, Y.Volume:
32
Year:
2015
Language:
english
Journal:
MATEC Web of Conferences
DOI:
10.1051/matecconf/20153205006
File:
PDF, 279 KB
english, 2015