Laser-induced damage to silicon CCD imaging devices

Optical Engineering 1991 / 05 Vol. 30; Iss. 5

Laser-induced damage to silicon CCD imaging devices

Zhang, Chen-Zhi, Watkins, Steve E., Walser, Rodger M., Becker, Michael F.
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Volume:
30
Language:
english
Journal:
Optical Engineering
DOI:
10.1117/1.2221305
Date:
May, 1991
File:
PDF, 898 KB
english, 1991
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