SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Wednesday 12 October 2016)] Optical Metrology and Inspection for Industrial Applications IV - Binocular stereo vision system based on phase matching
Han, Sen, Yoshizawa, Toru, Zhang, Song, Liu, Huixian, Huang, Shujun, Gao, Nan, Zhang, ZonghuaVolume:
10023
Year:
2016
Language:
english
DOI:
10.1117/12.2245853
File:
PDF, 539 KB
english, 2016