SPIE Proceedings [SPIE The International Conference on Micro- and Nano-Electronics 2016 - Zvenigorod, Russian Federation (Monday 3 October 2016)] International Conference on Micro- and Nano-Electronics 2016 - A simple calculation method for heavy ion induced soft error rate in space environment
Lukichev, Vladimir F., Rudenko, Konstantin V., Galimov, A. M., Elushov, I. V., Zebrev, G. I.Volume:
10224
Year:
2016
Language:
english
DOI:
10.1117/12.2267145
File:
PDF, 390 KB
english, 2016