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Effect of indium low doping in ZnO based TFTs on electrical parameters and bias stress stability
Cheremisin, Alexander B., Kuznetsov, Sergey N., Stefanovich, Genrikh B.Volume:
5
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4935789
Date:
November, 2015
File:
PDF, 1.18 MB
english, 2015