Electrical instability of high-mobility zinc oxynitride thin-film transistors upon water exposure
Kim, Dae-Hwan, Jeong, Hwan-Seok, Kwon, Hyuck-InVolume:
28
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/1361-6528/aa57b1
Date:
March, 2017
File:
PDF, 708 KB
english, 2017