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SPIE Proceedings [SPIE Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016) - Suzhou, China (Tuesday 26 April 2016)] 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment - Analysis of spectral mismatch error influences on short-circuit current measurement of reference solar cell
Zhang, Yudong, Wu, Fan, Xu, Ming, To, Sandy, Cai, Chuan, He, Yingwei, Zhang, Junchao, Xiong, Limin, Zhou, Taogeng, Meng, Haifeng, Zhang, Kejia, Zhang, BifengVolume:
9684
Year:
2016
Language:
english
DOI:
10.1117/12.2243596
File:
PDF, 267 KB
english, 2016