In situ transmission electron microscopy of...

Resolution and Discovery 2016 / 11 Vol. 1; Iss. 1

In situ transmission electron microscopy of resistive switching in thin silicon oxide layers

Duchamp, Martial, Migunov, Vadim, Tavabi, Amir H., Mehonic, Adnan, Buckwell, Mark, Munde, Manveer, Kenyon, Anthony J., Dunin-Borkowski, Rafal E.
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Volume:
1
Language:
english
Journal:
Resolution and Discovery
DOI:
10.1556/2051.2016.00036
Date:
November, 2016
File:
PDF, 641 KB
english, 2016
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