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Secondary resonance magnetic force microscopy using an external magnetic field for characterization of magnetic thin films
Liu, Dongzi, Mo, Kangxin, Ding, Xidong, Zhao, Liangbing, Lin, Guocong, Zhang, Yueli, Chen, DihuVolume:
107
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4930878
Date:
September, 2015
File:
PDF, 2.60 MB
english, 2015