[IEEE 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Las Vegas, NV, USA (2016.6.27-2016.6.30)] 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Material Classification Using Raw Time-of-Flight Measurements
Su, Shuochen, Heide, Felix, Swanson, Robin, Klein, Jonathan, Callenberg, Clara, Hullin, Matthias, Heidrich, WolfgangYear:
2016
Language:
english
DOI:
10.1109/CVPR.2016.381
File:
PDF, 959 KB
english, 2016