Mechanism of the Key Impact of Residual Carbon Content on...

The Journal of Physical Chemistry C 2017 / 03 Vol. 121; Iss. 12

Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays

Niu, Gang, Cartoixà, Xavier, Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Perez, Eduardo, Schubert, Markus Andreas, Zaumseil, Peter, Costina, Ioan, Schroeder, Thomas, Wenger, Christian
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Volume:
121
Language:
english
Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/acs.jpcc.6b12771
Date:
March, 2017
File:
PDF, 7.39 MB
english, 2017
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