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The real background and peak asymmetry in diffraction on nanocrystalline metals
Kaszkur, Zbigniew, Zieliński, Maciej, Juszczyk, WojciechVolume:
50
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576717003235
Date:
April, 2017
File:
PDF, 1.27 MB
english, 2017