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On the mechanisms of cation injection in conducting bridge memories: The case of HfO 2 in contact with noble metal anodes (Au, Cu, Ag)
Saadi, M., Gonon, P., Vallée, C., Mannequin, C., Grampeix, H., Jalaguier, E., Jomni, F., Bsiesy, A.Volume:
119
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4943776
Date:
March, 2016
File:
PDF, 1.30 MB
english, 2016