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Behavior of sensitivity at edge of thin-film magnetoimpedance element
Kikuchi, Hiroaki, Oe, Suguru, Uetake, Hiroaki, Yabukami, ShinVolume:
7
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4972889
Date:
May, 2017
File:
PDF, 3.14 MB
english, 2017