Sol–gel deposition and characterization of multilayer 2% Cu...

Journal of Materials Science: Materials in Electronics 2017 / 7 Vol. 28; Iss. 13

Sol–gel deposition and characterization of multilayer 2% Cu doped TiO2nano structured thin films

Khan, M. I., Bhatti, K. A., Qindeel, Rabia, Fazal-e-Aleem,, Naeem-ur-Rehman,, Alonizan, Norah
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Volume:
28
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-017-6690-3
Date:
July, 2017
File:
PDF, 1.20 MB
english, 2017
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