Understanding the cross-country effects of U.S. technology...

Journal of International Economics 2017 / 05 Vol. 106

Understanding the cross-country effects of U.S. technology shocks

Miyamoto, Wataru, Nguyen, Thuy Lan
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Volume:
106
Language:
english
Journal:
Journal of International Economics
DOI:
10.1016/j.jinteco.2017.03.008
Date:
May, 2017
File:
PDF, 839 KB
english, 2017
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