New Atom Probe Tomography Reconstruction Algorithm for Multilayered Samples: Beyond the Hemispherical Constraint
Rolland, Nicolas, Vurpillot, François, Duguay, Sébastien, Mazumder, Baishakhi, Speck, James S., Blavette, DidierVolume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927617000253
Date:
April, 2017
File:
PDF, 763 KB
english, 2017