Optical second harmonic imaging: a versatile tool to...

Optical second harmonic imaging: a versatile tool to investigate semiconductor surfaces and interfaces

Scheidt, T., Rohwer, E. G., von Bergmann, H. M., Stafast, H.
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Volume:
27
Language:
english
Journal:
The European Physical Journal Applied Physics
DOI:
10.1051/epjap:2004069
Date:
July, 2004
File:
PDF, 307 KB
english, 2004
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