Optical second harmonic imaging: a versatile tool to investigate semiconductor surfaces and interfaces
Scheidt, T., Rohwer, E. G., von Bergmann, H. M., Stafast, H.Volume:
27
Language:
english
Journal:
The European Physical Journal Applied Physics
DOI:
10.1051/epjap:2004069
Date:
July, 2004
File:
PDF, 307 KB
english, 2004